 |
|
|
|
|
Manufacturer of instrumentation and
software used to enhance and extend the operation and performance of
electron microscopes. Products are compatible with most brands of
electron microscopes (TEMs and SEMs) and cover the entire range of the
analytical process from specimen preparation and manipulation to
imaging and analysis.
For TEMS:
Etching/Coating Systems, Ion
Polishing System and other TEM specimen preparation tools. A complete
line of specimen holders including; analytical, cooling and heating
types. A full range of digital cameras plus PEELS and GIF Systems.
For SEMs: cryo stage, complete cryo
system, cathodoluminescence systems and tensile/heating stages
|
|
|
|
|
|
|
|
|
AXIC, Inc manufactures and distributes semiconductor plasma processing
equipment (ICP, PECVD, RIE Plasma), Thin Film Measurement instruments
(Ellipsometer, Spectroscopic and Discrete Wavelength Ellipsometry,
Film Thickness Probe, Reflectometer) and Rapid Thermal Processors.
Axic, Inc. is partnering with
AnnealSys,
Sentech Instruments
GmbH and
Secon GmbH, to bring a new era of advanced processing and
technology to the market place. |
|
|
|
|
|
|
|
|
|
Dumont tweezers are a continuation of a
line of fine watch making tools created in 1875 by the Dumont family in
the heartland of the Swiss watch industry. Originally made by hand with
hammer, anvil and files, the Dumont line of tweezers is now made by a
combination of sophisticated forging equipment and old world Swiss
craftsmanship.
|
|
|
|
|
|
|
|
|
|
MILLBROOK MINI-SIMS The Desktop SIMS unit from Millbrook revolutionizes surface chemical analysis and imaging. There are 3 modes of detections: Static SIMS (surface analysis), Imaging SIMS (spatial analysis), and Dynamic SIMS (depth analysis). Results are obtained within minutes.
|
|
|
|
|
|
|
|
|
|
Energy Beam Sciences is a manufacturer and distributor of sample preparation equipment, supplies, and accessories for electron and light microscopy. Their product line includes tungsten filaments for electron beam equipment, Denka LaB6 and TFE cathodes, and a unique line of accessories for EM and histology, including SEM specimen mount holders.
|
|
|
|
|
|
|
|
|
|
Chemical standards for microanalysis: Choose from over 230 pure elements, compounds, minerals, glasses, and alloys. Some are NIST traceable. Magnification Reference Standard: NIST and NPL traceable standards for all types of microscopy. Ion sputtering standards for calibrating ion etch rates. Specimen holders for JEOL
microscopes. |
|
|
|
|
|
|
|
|
