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JEOL's JSM-7500F, New Ultra High Resolution FE SEM -
August 7,2006
The JSM-7500F is an ultra high resolution FE SEM, which has been developed to satisfy the most demanding researchers in nanotechnology and related research field.
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JEOL's JEM-1400, New Transmission Electron Microscope -
August 7, 2006
The New JEOL's JEM-1400 is a 120kV TEM that provides outstanding results for beginners and experts alike.
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Alicona Imaging -
June 14, 2006
Soquelec is pleased to announce that it has been appointed as Canadian distributor for Alicona Imaging software.
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New Quantomix QX-202C capsule -
April 26, 2006
In situ studies of hydrated systems like cement or gypsum can now be carried out inside any SEM applying WETSEM™ Technology. Using WETSEM™ the sample is placed in a sealed specimen capsule under atmospheric pressure. The “as prepared” water to powder (cement, gypsum etc.) ratio is maintained, and the hydration process is unaffected by the vacuum in the SEM chamber.
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JEOL's JSM-6390 series and JSM-6490 series - High Performance General Purpose SEM -
April 21, 2006
JEOL has improved the electron optics based on a belief that high performance optics makes its operation easier.
The new super conical objective lens guarantees 3nm resolution at 30kV. A sharp image with good contrast makes its operation comfortable.
The new scanning system lets you go down below 8 times magnification. This low magnification improves efficiency of specimen survey. The zoom condenser lens maintains focus and area of interest so that you can optimize probe current intuitively.
The new optics forms a small electron probe diameter with large probe current for elemental analysis on a micro area.
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QuantomiX -
August 12, 2005
Soquelec is proud to annouce that it has been signed as the official Canadian distributor for QuantomiX.
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NanoWorld -
August 11, 2005
Soquelec is pleased to announce that it has been appointed as Canadian distributor for Nanoworld line of AFM probes.
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AccuTOF™-DART™ -
March 9, 2005
AccuTOF™-DART™ {DIRECT ANALYSIS IN REAL TIME}wins Pittcon Editor's Gold Award for Best New Product at Pittcon 2005
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JEOL CROSS SECTION POLISHER -
September 2004
JEOL is pleased to introduce its new SM-09010 Cross Section Specimen Preparation Device using an ARGON Ion Beam for SEM observation.
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V5-25-100-07-1-25.576MHz
Lot of 180 Tech Time VCXO's @ 25.576MHz
$490.00
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V5-50-100-07-1-18.432MHz
Lot of 60 VCXO's manufactured by Tech Time
$120.00
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100A0R9CP
Lot of SMT Microwave Capacitors 0.9 pf manufactured by American Technical Ceramics
$200.00
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