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Nano Indenters -
26 November 2009
Soquelec has been appointed exclusive Canadian distributor of the IBIS line of Nanoindenters manufactured by Fischer-Cripps Laboratories of Australia.
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JEOL's JSM-7500F, New Ultra High Resolution FE SEM -
August 7,2006
The JSM-7500F is an ultra high resolution FE SEM, which has been developed to satisfy the most demanding researchers in nanotechnology and related research field.
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JEOL's JEM-1400, New Transmission Electron Microscope -
August 7, 2006
The New JEOL's JEM-1400 is a 120kV TEM that provides outstanding results for beginners and experts alike.
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New Quantomix QX-202C capsule -
April 26, 2006
In situ studies of hydrated systems like cement or gypsum can now be carried out inside any SEM applying WETSEM™ Technology. Using WETSEM™ the sample is placed in a sealed specimen capsule under atmospheric pressure. The “as prepared” water to powder (cement, gypsum etc.) ratio is maintained, and the hydration process is unaffected by the vacuum in the SEM chamber.
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NanoWorld -
August 11, 2005
Soquelec is pleased to announce that it has been appointed as Canadian distributor for Nanoworld line of AFM probes.
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AccuTOF™-DART™ -
March 9, 2005
AccuTOF™-DART™ {DIRECT ANALYSIS IN REAL TIME}wins Pittcon Editor's Gold Award for Best New Product at Pittcon 2005
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JEOL CROSS SECTION POLISHER -
September 2004
JEOL is pleased to introduce its new SM-09010 Cross Section Specimen Preparation Device using an ARGON Ion Beam for SEM observation.
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